Photo | Mfr. Part # | Availability | Price | Quantity | Datasheet | Series | Package/Case | Packaging | Product Status | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Grade | Qualification | Mounting Type | Supplier Device Package |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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MC100EP116FAIC TCVR/DRVR HEX DIFF ECL 32LQFP |
3,511 | 6.41 |
|
- |
100EP | 32-LQFP | Tray | Obsolete | Differential Receiver/Driver | 3V ~ 5.5V | - | -40°C ~ 85°C | - | - | Surface Mount | 32-LQFP (7x7) |
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MC10EP116FAR2IC RCVR/DRVR HEX 6BIT DFF 32LQFP |
2,140 | 6.41 |
|
- |
10EP | 32-LQFP | Tape & Reel (TR) | Obsolete | Differential Receiver/Driver | 3V ~ 5.5V | 6 | -40°C ~ 85°C | - | - | Surface Mount | 32-LQFP (7x7) |
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MC100LVEL17DWR2GIC RCVR DFF QUAD ECL 3.3V 20SOIC |
3,166 | 3.15 |
|
![]() Datasheet |
100LVEL | 20-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Active | Differential Receiver | 3V ~ 3.8V | 4 | -40°C ~ 85°C | - | - | Surface Mount | 20-SOIC |
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SN74LVT8986GGVIC LINK ADDRSS SCAN-PORT 64-BGA |
4,409 | 6.46 |
|
![]() Datasheet |
74LVT | 64-LFBGA | Tray | Obsolete | Linking Addressable Scan Ports | 2.7V ~ 3.6V | - | -40°C ~ 85°C | - | - | Surface Mount | 64-BGA MICROSTAR (8x8) |
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SN74ABT8952DWIC SCAN-TEST-DEV/XCVR 28-SOIC |
3,550 | 6.62 |
|
![]() Datasheet |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tube | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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LC75281E-EEQUALIZER |
34,539 | 6.65 |
|
- |
* | - | Bulk | Active | - | - | - | - | - | - | - | - |
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9341PCLOGIC CIRCUIT |
8,950 | 6.65 |
|
![]() Datasheet |
- | 24-DIP (0.600", 15.24mm) | Bulk | Active | Arithmetic Logic Unit | 4.75V ~ 5.25V | 4 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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NB7VPQ16MMNHTBGIC CML DVR PRE-EMPH 1CH 16-QFN |
3,525 | 6.67 |
|
- |
- | 16-VFQFN Exposed Pad | Tape & Reel (TR) | Obsolete | CML Driver with Selectable Equalizer Receiver | 1.71V ~ 2.625V | - | -40°C ~ 85°C | - | - | Surface Mount | 16-QFN (3x3) |
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74F181SPCALU, F/FAST SERIES, 4-BIT, TTL |
1,125 | 6.68 |
|
![]() Datasheet |
74F | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Arithmetic Logic Unit | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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SNJ54AS181BJTARITHMETIC LOGIC UNIT |
104 | 6.71 |
|
![]() Datasheet |
* | - | Bulk | Active | - | - | - | - | - | - | - | - |
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MC100E416FNIC LINE RCVR QUINT DIFF 28-PLCC |
1,972 | 3.67 |
|
![]() Datasheet |
100E | 28-LCC (J-Lead) | Tube | Obsolete | Differential Receiver | 4.2V ~ 5.7V | 5 | 0°C ~ 85°C | - | - | Surface Mount | 28-PLCC (11.51x11.51) |
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MC10E416FNIC LINE RCVR QUINT DIFF 28-PLCC |
2,288 | 3.67 |
|
![]() Datasheet |
10E | 28-LCC (J-Lead) | Tube | Obsolete | Differential Receiver | 4.2V ~ 5.7V | 5 | 0°C ~ 85°C | - | - | Surface Mount | 28-PLCC (11.51x11.51) |
|
SN74BCT8240ADWRIC SCAN TEST DEVICE BUFF 24-SOIC |
4,522 | 6.85 |
|
![]() Datasheet |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC |
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SN74BCT8240ANTIC SCAN TEST DEVICE BUFF 24-DIP |
2,747 | 6.85 |
|
![]() Datasheet |
74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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SN74SSTVF16859GRIC REG BUFFER 13-26BIT 64-TSSOP |
3,170 | 4.72 |
|
![]() Datasheet |
74SSTVF | 64-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 13, 26 | 0°C ~ 70°C | - | - | Surface Mount | 64-TSSOP |
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SN74SSTV16859DGGRIC REG BUFFER 13-26BIT 64-TSSOP |
2,608 | 4.72 |
|
![]() Datasheet |
74SSTV | 64-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 13, 26 | 0°C ~ 70°C | - | - | Surface Mount | 64-TSSOP |
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SN74BCT8374ANTIC SCAN TEST DEVICE W/FF 24-DIP |
2,530 | 4.13 |
|
![]() Datasheet |
74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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SN74ABT8646DWIC SCAN-TEST-DEV/XCVR 28-SOIC |
3,830 | 7.81 |
|
![]() Datasheet |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Bulk | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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HMU16JC-4516 X 16-BIT PARALLEL MULTIPLIER |
3,912 | 7.05 |
|
![]() Datasheet |
- | 68-LCC (J-Lead) | Bulk | Active | Binary Rate Multiplier | - | - | - | - | - | Surface Mount | 68-PLCC (24.23x24.23) |
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SN74SSQE32882ZALRIC REGISTERING CLOCK DVR 176-BGA |
2,557 | 4.89 |
|
![]() Datasheet |
- | 176-TFBGA | Tape & Reel (TR) | Not For New Designs | 1:2 Registered Buffer with Parity | 1.425V ~ 1.575V | 28, 56 | 0°C ~ 85°C | - | - | Surface Mount | 176-NFBGA (13.5x8) |